What do you need to know about compliance test measurements for USB 3.0? At 5 Gbps your jitter margins for Superspeed USB are a tiny fraction of what you had for USB 2.0. On top of that you will have to consider transmitter de-emphasis levels, spread spectrum clocking, receiver equalizer settings, receiver equalizer and jitter tolerance testing plus new cables and connectors taking margin from your design. This presentation covers the USB 3.0 testing challenges you face for Superspeed product and channel testing as you move to 5Gbps performance levels. You will learn how official transmitter and receiver certification testing is performed at workshops. You will also learn about compliance testing pitfalls, the common problems that cause compliance testing failures during certification.

Who should view this webcast:
USB Design Engineers, Signal Integrity Engineers, Quality Engineers, Validation Engineers, Test Engineers, Architect, Project Manager, Program Manager, Application Manager, Application Engineer

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Jim Choate, Product Manager – Measurement Technologies, Oscilloscopes Division, Agilent Technologies
Jim Choate received a Bachelor’s degree in Electrical Engineering from the University of Idaho in 1997 and started with Intel working on motherboard design and validation. Building on his platform expertise he joined the Intel C&I team in 1999 working on specifications and compliance programs for USB 2.0, SATA, PCI Express, WUSB and WiMedia UWB PHY testing. Jim joined Agilent Technologies, Inc. in 2007 as an Applications Specialist and Product Manager for the Oscilloscopes Division where he will continue to apply his expertise in measurement theory to USB 2.0, Wireless USB and PCI Express 2.0 compliance and measurement theory.