USB 2.0 Electrical and Protocol Testing using an Oscilloscope
USB is now the standard interface on silicon development platforms, personal computers, consumer electronics and test equipment. What do you need to know about designing and testing USB 2.0 products to ensure they work reliably and meet the USB-IF compliance test requirements? This webcast will provide details of Agilent's industry leading USB 2.0 electrical compliance test tools. This presentation will also cover advanced debugging capabilities utilizing innovative new scope based USB 2.0 protocol triggering and decode solutions. These new scope tools allow quick verification of USB 2.0 designs to demanding specification requirements.
This presentation will provide you with the information you need to meet tight USB 2.0 product development schedules.
Duration: One hour
Who should view this webcast:
USB product developers, USB silicon validation engineers, USB electrical testing engineers, USB design engineers, USBIF members, Motherboard (MB) design engineers, MB validation engineers
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Jim Choate, USB Technology Product Manager, Digital Test Division, Agilent Technologies, Inc
Jim received a Bachelors degree in Electrical Engineering from the University of Idaho in 1997 and started with Intel working on motherboard design and validation. Building on his platform expertise he joined the Intel C&I team in 1999 working on specifications and compliance programs for USB 2.0, SATA, PCI Express, WUSB and WiMedia UWB PHY testing. Jim served as the USB Implementors Forum (USB-IF) compliance committee chairman from 2003-2007.
Jim joined Agilent Technologies, Inc. in 2007 as an Applications Specialist and Product Manager for the Digital Test Division where he continues to apply his expertise in measurement theory to high speed serial communications standards and is the USB Technology Product Manager.
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