Overview:
Differential structures such as backplanes and
cables are the primary means for transmitting high speed serial data signals.
Signal integrity of these systems is determined by the characteristics of the
media such as insertion loss, crosstalk, and differential to common mode
conversion. Complete measurement of the mixed mode S-Parameters is often
performed by transforming single-ended S-Parameters and assuming that the system
is linear. In some cases, linearity cannot be assumed such as where active
components are used.

This session will describe how to measure true differential S-Parameters
which can be measured even in the presence of non-linear
elements.

What you will learn:

  • Signal Integrity characteristics of high speed serial data signals
  • Linear versus non-linear system assumptions
  • How to measure true differential s-parameters

Presenter:
Chris
Scholz, Ph.D, Product Manager, Rohde & Schwarz

Chris Scholz has
a Ph.D. (Electrical Engineering) and an MS from Georgia Tech, in addition to an
MS from the TU Carolo-Wilhelmina in Braunschweig. Prior to joining Rohde &
Schwarz he worked as a Field Applications Engineer at LeCroy specializing in
high-speed serial standards and signal integrity tests. He’s also worked at
Intel, leading product development in integrated silicon photonics devices, and
as a research faculty at Georgia Tech working on millimeter Wave technology and
equalizer ICs for fiber-optical communications systems.