Continuous improvements in quality and reduction in early life failures are key goals for semiconductor manufacturers, especially those supporting vehicle electrification applications. Historically, semiconductor companies would deploy early life failure reduction efforts with electrical test or geospatial techniques to reject or test out potential failures.

Today’s vehicle electrification market has even stricter requirements. In the quest for zero defects, companies must reduce manufacturing errors and variability. Inline thermal resistance measurements add another road to quality for semiconductor companies. Thermal transient testing can measure semiconductor junction temperature responses to short pulses and provide insights to potential manufacturing defects.

In this webinar, we will explain how to apply thermal transient testing technology for quality testing and how to evaluate results.

 

Check out this clip below, and register to view the entire webinar.