Overview:
Development work on very high frequency devices
and metamaterials has been limited by the difficulty in making good tests.
Developers and users of amplifiers, mixers, filters, detectors, receivers,
radios and metamaterials at these frequencies need tools for making critical
measurements at mmwave and higher frequencies. This webinar show how instruments
you are familiar with including Vector Network Analyzers, Signal Analyzers and
Sources can be extended in frequency to make a variety of precision measurements
at Gigahertz to Terahertz frequencies.

What attendees will learn:

  • Key applications using mmwave to Terahertz frequencies
  • Challenges in making measurements at very high frequencies
  • Measurement capabilities available
  • Test setups for component and metamaterial measurements



Presenter:
Dr.
Jeffrey L. Hesler, Chief Technology Officer, Virginia Diodes,
Inc.

Dr. Jeffrey L. Hesler received the B.S.E.E. in 1989 from
Virginia Tech and the Ph.D. in 1996 from the University of Virginia. He is
member of the Board of Directors and shareholder of Virginia Diodes, Inc. and
serves as Chief Technology Officer of the corporation. In addition, he is
affiliated with the University of Virginia as a Visiting Research Assistant
Professor in the Department of Electrical and Computer Engineering.