Overview:
Embedded systems increasingly employ a
combination of low speed serial, analog voltages and RF communications which are
tightly synchronized in time. This session will discuss the background of
performing time and frequency domain analysis on these systems with example
measurements on a digitally controlled RF transmitter.

What will you
learn?

  • The challenges of debugging embedded systems
  • Frequency domain analysis and FFT basics
  • Time gating, Dynamic range and Triggering considerations
  • PLL locking measurement example




Presenter:
Mike
Schnecker, Business Development Manager, Rohde & Schwarz

Mike
Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in
electrical engineering. He has 22 years of experience in the test and
measurement industry in applications, sales and product development roles, and
has specialized in signal integrity applications including jitter using
oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr.
Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was
responsible for the deployment of the SDA series of serial data analyzers.