How do you provide stimulus to your DigRFv4 RFIC when no baseband IC is available? How do you verify that your LTE baseband IC is properly decoding the digital IQ information? How do you debug the integration of your mobile device? To learn more about how to make these and other critical measurements, please join us for this webcast. Discuss with Agilent the seamless integration of physical layer debug, digital stimulus, protocol test and RF measurements.

Duration: One hour

Who should view this webcast:
R&D teams and engineers in the mobile wireless industry, who are turning on, characterizing, and integrating LTE RFIC or baseband IC chipsets and devices.

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Gregg Buzard

In 1979 Gregg joined Agilent Technologies (formerly Hewlett-Packard) in Rockville, Maryland as a support engineer for microwave and ATE systems. Since then he has held positions in application engineering, product development and product marketing. Gregg is currently the Product Marketing Engineer responsible for the digital wireless business. His product responsibilities include logic analysis and protocol test tools for a variety of test solutions including Digital RF, MiPi D-Phy, and FPGA debug.

Chris Van Woerkom

Chris Van Woerkom has held a wide variety of marketing and technical positions during his 31 years at Agilent Technologies and Hewlett Packard. His responsibilities have included product management, technical support, business development, and product planning for instrumentation, operating systems, peripherals, applications software, and communications products.

Chris currently manages outbound marketing activities for the LXI, Digital Wireless and Aerospace/Defense programs within Agilent Technologies.

Chris holds a Masters in Business Administration from the University of Colorado and a Bachelor of Science degree in Electrical Engineering from the University of California at Davis. He lives in Fort Collins, Colorado, USA.