Overview:
Jitter measurements are commonly done taking small snapshots in time, yet systems often experience jitter from sources that occur over relatively long time intervals, which may not be accounted for using short time interval measurements methods.
In this webinar we will present the application of a real time, digital clock recovery and trigger system to the measurement of jitter on clock and data signals. Details of the measurement methodology will be provided along with measurement examples on both clock and data signals.

You Will Learn:

  • What is Jitter
  • Different types of Jitter
  • Jitter measurement techniques
  • Benefits of Jitter analysis using real-time DDC techniques

Presenter:


Mike Schnecker

Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.