Jitter measurements are commonly made taking small snapshots in time. Yet systems often experience jitter from sources that occur over relatively long time intervals, which may not be accounted for using short time interval measurements methods. This webinar presents the application of a real time, digital clock recovery and trigger system to the measurement of jitter on clock and data signals. Details of the measurement methodology will be provided along with measurement examples on both clock and data signals.

What you will learn:

  • What is Jitter
  • Different types of Jitter
  • Jitter measurement techniques
  • Benefits of Jitter analysis using real-time DDC techniques

Who should attend:
Engineers, technicians and designers who work with embedded systems


Mike Schnecker
Business Development Manager, Rohde & Schwarz

Mike Schnecker has more than two decades experience in the test and measurement industry in applications, sales and product development roles. He specializes in all things oscilloscope related, especially signal integrity applications including jitter and timing. Prior to joining Rohde & Schwarz, Mike held positions at LeCroy and Tektronix. In 2014 Mike won a Best Paper Award in the Interconnect Design & Test category at DesignCon for his paper on “Real Time Jitter Measurement”.