This Webcast will cover the basics of parametric test. This includes topics such as shielding and guarding, coaxial versus triaxial cables, SMU fundamentals, Kelvin measurement, low-current measurement, on-wafer measurement and capacitance measurement (to name just a few). Common mistakes and pitfalls made by inexperienced users will be illustrated and methods to avoid them will be explained. Although this Webcast is designed for users with no previous parametric test background, experienced users may also find the material a useful review.

Who should view this webcast:
The webcast is of interest to engineers working in semiconductor process development, reliability, failure analysis and device design. Educators and researchers involved with semiconductor design, nanotechnology and solar cell development would also find the webcast useful and informative.

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Alan Wadsworth, Market Development Manager
Alan Wadsworth is the North and South American Market Development Manager for Agilent’s semiconductor test division. Alan holds bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology and an MBA from Santa Clara University. Alan has over 25 years of experience in the semiconductor industry in both design and test.