New Power Device Analyzer/Curve Tracer Solves High Power Device Testing Challenges
The Agilent B1505A Power Device Analyzer / Curve Tracer meets the challenges posed by state-of-the-art power devices. It is the only single box solution available today with the capability to characterize high power devices from the sub-picoamp level up to 3000 volts and 20 amps. Moreover, it can also measure capacitance at 3000 V of DC bias.
A built-in curve tracer mode provides traditional and familiar curve tracer functionality, permitting quick device characterization with minimal measurement setup effort. An innovative automatic recording feature prevents data loss even if the device under test (DUT) is inadvertently destroyed.
In addition to these impressive measurement capabilities, the intuitive EasyEXPERT software environment makes data analysis a snap. You can also easily export data into you PC-based work environment and use this data to generate presentations and reports.
The B1505A supports a standardized test fixture solution, the N1259A, which is compatible with a variety of different socket types. The B1505A also supports on-wafer testing of power devices, thereby eliminating the need to package the devices first. This capability dramatically improves the turn-around-time when testing devices in the lab.
This web-based seminar will cover these capabilities in detail and show how they can be used to provide you with revolutionary efficiency improvements for power device evaluation
Duration: One hour
Who should view this webcast:
Engineers, scientists, and university researchers involved in the development, test, or verification of high power semiconductor devices would benefit from attending this seminar. Also, anyone currently using an old-style analog curve tracer and looking for a replacement would find this seminar of great interest.
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Alan Wadsworth, Agilent Technologies
Alan has Bachelors and Masters degrees from MIT in electrical engineering and an MBA from Santa Clara University. He is currently the North and South American Market Development Manager for Agilent's Hachioji Semiconductor Test Division.
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