Agilent’s new B2900A series of benchtop SMUs offer unprecedented test speed, dynamic range and measurement resolution. The B2900A series can source up to 210 Volts, 3 Amps (DC) and 10.5 Amps (pulsed). It can also measure with 10 fA and 100 nV resolution. In addition, a 4.3 inch color display and intuitive graphical user interface greatly facilitate interactive measurement operation. This web seminar will explain the new features and capabilities of this innovative product and show how it can be used to test a wide variety devices (resistors, diodes, LEDs, varistors, etc.) in both laboratory and production environments.

Who should view this webcast:
This webcast would be of interest to a very wide audience of engineers, scientists and educators working in many different fields, such as semiconductor characterization and modeling, device reliability, component test, failure analysis, and nanotechnology.

Alan Wadsworth, Market Development Manager, Agilent Technologies

Alan Wadsworth is the North and South American Market Development Manager for Agilent’s semiconductor test division. Alan holds bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology and an MBA from Santa Clara University. Alan has over 25 years of experience in the semiconductor industry in both design and test.