Evaluating frequency responses of components and circuits in electronic equipment used in computer, automotive, medical, and aerospace & defense industries is essential for ensuring the equipment performance. Measurements of DC-DC converters, PDN (power distribution network) components in high-speed digital circuits, and signal-conditioning amplifiers for sensors are made within near-DC to RF. We need to have better understandings of low-frequency network measurement techniques for these applications such as high-attenuation, DC-biased, and high-impedance probing, and control-loop circuit test.

This seminar presents fundamentals on LF network analysis, and typical application examples and measurement tips, featuring Agilent's new 5 Hz-to-3 GHz ENA Network Analyzer.

Duration: One hour

Who should view this webcast:
Engineers working on analog circuits and power management circuits of electronic equipment and systems in various industrial fields, including computer, automotive, medical, aerospace & defense, and so on.

Engineers working on low-frequency devices such as DC-DC converters, MEMS devices, sensor amplifiers, EMC devices.

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Yasuhiro Mori, senior product manager for the Component Test Division Agilent Technologies

Yasuhiro Mori is a senior product manager for the Component Test Division of Agilent Technologies in Kobe, Japan. He is responsible for product marketing and application developments for the network analyzers. Most recently he worked for the new LF-RF network analyzer and its applications.