The requirement for designers to be well versed in both digital and RF equipment is becoming more and more apparent as digital designs have ever increasing speeds. For engineers that are comfortable working with oscilloscopes, a vector network analyzer might seem intimidating; however, this tool can be invaluable to the characterization of linear and nonlinear devices. This webcast will cover the principles of measuring high-speed electrical devices with network analyzers, including what kind of measurements are made. This webcast will walk through a few RF fundamentals such as transmission lines and the Smith chart, leading to the concepts of reflection, transmission and S-parameters. The key advantages of using a network analyzer for interconnect testing will be reviewed in great detail, with time for Q&A.

Who should attend:
Design, test and validation engineers who need to characterize and validate compliance of their high speed digital designs.

Mike Resso, Expert Product Marketing Engineer, Agilent Technologies, Inc.
Mike Resso is the Signal Integrity Application Scientist in the Component Test Division of Agilent Technologies and has over twenty-five years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including a book on signal integrity. Mike has been awarded one US patent and has twice received the Agilent “Spark of Insight” Award for his contribution to the company. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.