This webcast discusses new methods for characterizing frequency converters with external or embedded local oscillators, using Agilent’s PNA-X high performance network analyzer and the latest measurement algorithms. Compared to legacy systems built around spectrum analyzers and standalone signal sources, modern VNA-based systems are much faster, and more accurate, and they can accomplish many measurements with a single connection to the device under test. Featured measurements include group delay without the use of a reference mixer, source-corrected noise figure, and swept intermodulation distortion.

Who should view this webcast:
Engineers who design or test frequency converters

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David Ballo, Application Development Engineer, Agilent Technologies

David Ballo works for Agilent Technologies’ Component Test Division in Santa Rosa, California, where he has acquired 30 years of RF and microwave measurement experience. David spent his first ten years in R&D doing analog and RF circuit design on spectrum and vector-signal analyzers. Since then, he has worked in marketing developing and presenting seminars and papers, and writing application notes and technical articles on a wide variety of network- and spectrum-analyzer measurement topics.