5G and mmWave technologies are proliferating to many applications. Instrumentation and test solutions for this rapidly growing market are in high demand.

In this webcast, we present a robust mmWave signal chain solution that can be employed to characterize and test mmWave devices using the state of the art circuits from Analog Devices. We will also present signal chain optimization using error vector magnitude (EVM) as a test metric.

Attendees will learn about:

  • Identifying and selecting components for mmWave signal chains
  • System level performance optimization through EVM analysis