Overview: 
Increased use of Modular Test and Measurement Instrumentation particularly in the areas of PXI, LXI and the new AXIe have decreased footprint and increased speed of ATE systems. But long-term supportability and migration through the
product life cycle are a challenge. In this Webcast you’ll learn to:
  • Enable better measurements through the use of higher performance modules
  • Improve ATE system flexibility by use of open SW architecture
  • Mitigate compatibility and support risks through flexible software concepts
Who should view this webcast:
This Webcast would be of interest to anyone involved in developing or maintaining automated test and measurement systems.
Giveaway:
Registrants who completely fill out the feedback form by January 15, 2011 will be eligible to win one of two $75 Amazon.com gift certificates. Drawing only open to residents of the 50 United States and Canada (except Quebec). Official rules.
Presenter: 
Von CampbellVon Campbell, Strategic Planning Manager, Modular Products Operation
Von joined Agilent Technologies (Hewlett-Packard) as a development engineer in 1982. Today, he manages Strategic Product Planning for the Modular Products Operation and also oversees Agilent’s involvement in multiple industry consortia; IVI, LXI, VXI, AXIe and PXISA. Von is the President of the LXI Consortium.
During his 26 years with the company, Von has been led several of Agilent’s Marketing and R&D programs (organizations) focused on general-purpose instruments, data acquisition, manufacturing test systems, connectivity software and common instrument infrastructure.
Von holds a Bachelor’s degree in Electrical Engineering from Purdue University and a Master’s degree in Electrical Engineering from Stanford University.