This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.

Participant Objectives

By participating in this seminar, you will learn and understand:

  • Measurement techniques required for measuring very small currents
  • Sources of measurement error that will affect such low current measurements
  • Measurement solutions that can be used in low current measurement applications

Who Should Attend

This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.

Speaker:

Jonathan Tucker, Senior Marketer and Product Line Manager, Keithley Instruments, Inc.

Jonathan Tucker is the senior marketer for Keithley’s research and education business and sensitive measurements product line manager. He joined Keithley in 1987 and has held numerous positions. Tucker holds a Bachelor of Electrical Engineering degree from Cleveland State University and an MBA from Kent State University.