High Speed Digital Test Fixture Characterization and De-Embedding
It is common for designers to want to measure a signal at a location that cannot be physically measured using an oscilloscope. With Agilent Technologies newest InfiniiSim products, together with Gigatest labs test-fixture de-embed process, engineers can now predict waveform performance directly at the chip.
Who should attend:
Signal Integrity Engineers, Digital Test Engineers, Engineering Managers, Digital Design Engineers
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Brian Fetz is a Technical Program Manager focusing on De-Embedding solutions as well as Digital Display Interfaces for Agilent Technologies. He graduated from California Polytechnic State University at San Luis Obispo in 1983 and completed a Masters in Electrical Engineering from the University of Idaho in 1991. Before his current position, Brian worked on Agilent's Bluetooth and Signal Integrity solutions where he led a technical team in evaluating jitter measurement solutions. Prior to that, his focus was in manufacturing where he has worked as a production and test engineer for Base Station and Mobile testing products.
Brian is on the board of directors for the Video Electronics Standards Association and a member of the board of directors for Vera Water and Power, his local community's utility. He currently serves as the DisplayPort Compliance Test Specification editor.
Rob Sleigh is a Product Marketing Engineer for sampling scopes in Agilent’s Digital Test Division. He is responsible for product development for the division’s high-speed electrical and optical digital communications analyzer and jitter test products.
Rob’s experience at Agilent/Hewlett-Packard includes 5 years in technical support, and over 6 years in sales and marketing. Prior to working at Agilent/HP, Rob worked for 10 years at Westel Telecommunications in Vancouver, British Columbia, Canada, designing microwave and optical telecommunication networks. Rob earned his B.S.E.E. degree from the University of Victoria.
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