Digital designers measure signals in the time domain using
oscilloscopes however analyzing signals in the frequency domain can
reveal detail that is not readily visible in the time domain. Most
digital oscilloscopes include basic spectral analysis for this purpose
which is implemented in software using a Fast Fourier Transform (FFT).
Frequency domain analysis provides the ability to measure small signals
buried within complex time domain waveforms but there are also more
traditional frequency domain measurements such as channel power and
total harmonic distortion that are possible. The benefit of using an
FFT for these traditional measurements is that both steady state and
transient (burst mode) signals can be measured. This webinar will
review some of the basics of using FFT analysis as well as a unique
implementation of frequency domain analysis using a real time digital
down converter and FFT which allows both high dynamic range and real
time processing.

  • Review of FFT basics: sample rate, resolution bandwidth, windowing and record length
  • Signal acquisition considerations for FFT dynamic range and accuracy
  • Digital down conversion and overlap processing
  • FFT measurement examples
    • Channel power/adjacent channel power
    • Total harmonic distortion
    • Correlating time domain and frequency domain measurements

This is a one-hour seminar


Michael Schnecker, Business Development Manager, Rohde & Schwarz
Mike Schnecker has a BS from Lehigh University and an MS from Georgia
Tech both in electrical engineering. He has 22 years of experience in
the test and measurement industry in applications, sales and product
development roles and has specialized in signal integrity applications
including jitter using oscillosocpes and other instruments. Prior to
joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and
Tektronix. While at LeCroy, he was responsible for the deployment of the
SDA series of serial data analyzers.