Overview:
With technologies shrinking and design complexity increasing, it is
critical that embedded memory test and repair solutions keep up with the
advances in order to consistently provide superior test quality and
yield optimization. The embedded test approaches developed for designs
done a few years ago are not sufficient for today’s designs, which are
bigger, faster, hierarchical and much more sensitive to area, timing and
power. Similarly, the embedded test solutions developed for 90-nm
technology nodes will not deliver the same level of test quality,
diagnosis accuracy and repair efficiency for 28-nm technology nodes, as
memory defects and failure mechanisms change as process technologies
shrink. We will present the key points of interest for implementing
embedded memory test, repair and diagnostics solution in today’s
designs.

What you will learn:

  • The technical trends and challenges associated with embedded test, repair and diagnostics in today’s designs.
  • The trade-offs and design impact of various solutions.
  • How Synopsys’ DesignWare® STAR Memory System® can meet your embedded test, repair and diagnostics needs.

Target audience:

Designers, DFT engineers, test engineers, product engineers and foundry
engineers that are, or will be, designing or characterizing the complex
SoCs in 40-nm or 28-nm technology nodes.

Estimated length: 50 minutes, 10 minutes Q&A

Presenters:

Yervant Zorian, Chief Architect, Synopsys
Dr. Zorian is the Chief Architect at Synopsys for embedded test & repair products in Mountain View, California.

Formerly, he was Distinguished Member of Technical Staff AT&T Bell
Laboratories, Vice President and Chief Scientist of Virage Logic and
Chief Technologist at LogicVision. He received an MS degree in Computer
Engineering from University of Southern California, a PhD in Electrical
Engineering from McGill University, and an MBA from Wharton School of
Business, University of Pennsylvania.

He is currently the President of IEEE Test Technology Technical Council
(TTTC), the Vice General Chair of Design Automation Conference (DAC),
the Editor-in-Chief Emeritus of Design & Test of Computers, the
founder & chair of IEEE 1500 Standardization Working Group, and an
Adjunct Professor at University of British Columbia.




Sandeep Kaushik, Product Marketing Manager, Synopsys
Sandeep Kaushik is the Product Marketing Manager for the Embedded Memory
Test and Repair product line at Synopsys. Sandeep brings over 11 years
of experience in the field of Design-for-Test. Sandeep holds a
Bachelor’s Degree in Electrical Engineering from the Indian Institute of
Technology in Delhi, India and a Master’s Degree in Electrical
Engineering from Stanford University. He is currently working towards
his Master’s Degree in Business Administration from the HAAS School of
Business, University of California, Berkeley.