Overview:
Test engineers who develop systems for electronic functional and design validation test face unique challenges not found on the engineer’s bench-top. Test equipment is commonly located far from the device under test (DUT), in some cases by several meters. Special techniques are required for accurate voltage, current and resistance measurements. Two and four wire measurements, isolated instrumentation and methods to address ground loops all need special attention to achieve the required results. Also, DUT pin-counts can be very large. In particular, design validation systems will likely have dozens of units in thermal chambers. This presents challenges to effectively access all of the DUT pins while meeting aggressive performance and budget targets.


This Webcast will present best practices for electronic functional and design validation test to help the test engineer achieve accurate, reliable measurements. Signal routing methods for low noise and floating vs. single ended measurements will be discussed. Practical techniques for source V/measure I and source I/measure V, and how they are used for basic parametric measurements will be presented.

The test engineer will come away from this presentation with the basic understanding and building blocks needed for tackling their next electrical test system challenge.


Who should attend:
Test engineers and system integrators who develop systems for electronic functional and design validation testing


Giveaway:
Registrants who completely fill out the feedback form by September 17, 2010 will be eligible to win one of two $75 Amazon.com gift certificates. Drawing only open to residents of the 50 United States and Canada (except Quebec). Official rules.

Presenter:
Al Lesko, Application Engineer, Agilent Technologies
Al joined Agilent Technologies (Hewlett-Packard) in 1980 working as an R&D engineer on signal source and measurement instrumentation projects as well as development on the popular HP-3070 in-circuit tester test system. Al also worked on a variety of test system applications, and was the key hardware system architect on the Agilent TS-5400 Series II automotive functional test system.

Al Holds a BS degree in Electrical Engineering from the University of Michigan, Ann Arbor Michigan, and a BA in Math & Physics from Albion College, Albion Michigan.