From stealth materials to dielectric substrates, accurate characterization of their electromagnetic properties at microwave and mm-wave frequencies provide engineers with critical information needed for material and circuit design, modeling, research, manufacturing and quality control. Many measurement methods exist, but which to choose is often a mystery. This seminar will clear the air by providing an overview of measurement methods, with strengths, limitations and applications of each advantage.

Duration: One hour

Who should view this Webcast:
Electrical Engineers and Technicians in working in microwave and mm-wave material and circuit design, modeling, research, manufacturing or quality control.

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Shelley Begley, Application Development Engineer

Shelley Begley has 25 years experience in the HP/Agilent network analyzer business, working in production engineering electrical metrology, and product marketing. She currently leads a small team of both R&D and marketing, focused on advancing dielectric measurement techniques. She has given countless papers and seminars around the world on the topic.