Today’s demand to produce smaller electronic products for high-speed digital, mobile, and RF applications at very tight conductor pitches can result in very serious reliability issues. A typical printed wiring board (PWB) will contain several interacting conductors ranging from mechanically drilled holes, micro-vias, and inner planes at very tight spacing’s. In the past, electrochemical corrosion failure modes such as conductive anodic filament (CAF) were restricted to high voltage applications. In modern day electronics, CAF failure concerns become more important for low voltage applications due to the tighter conductor spacing which results in higher voltage gradients, and hence increased risks of CAF failure.

Attendees Will Learn:

  • Factors that enhance CAF failure
  • Importance of hole drilling in designing an appropriate CAF test vehicle
  • Evaluate the interaction between solder flux and PWB material

Register for this webinar to receive a thorough overview of the issues that can cause false CAF failures. This webinar will show the important need to test for CAF due to today’s demand for compact electronic devices, as well as shed light on the chemistry that leads to CAF formation.


Dr. Antonio Caputo
Reliability Scientist, Analytical Services Lab, Isola Group

Dr. Antonio Caputo is a reliability scientist working on CAF in the Analytical Services Lab at Isola Group. He has spent over 10 years working on electrochemical corrosion failure modes. He has spent time trying to understand the importance of CAF in collaboration with the center for microelectronics, assembly, and packaging (CMAP), Blackberry, and other world experts working on CAF. Antonio Caputo has been able to understand the importance of hole drilling, and the chemical nature of CAF through several publications and book chapters. Antonio Caputo obtained a chemistry degree, engineering degree, and Ph.D. all from the University of Toronto. Upon completion of his doctorate, Antonio was a postdoctoral associate at the Massachusetts Institute of Technology working for Professor Donald R. Sadoway. Antonio’s postdoctoral work has led to several publications, patents, and conference presentations in the field of energy storage. Antonio is still a research affiliate at MIT.