Effective Crosstalk Characterization
The integrity of serial data passing through ICs,
discrete circuits and backplanes can be degraded by crosstalk. The possibility
is greater as density and data rates increase. Simulation and modeling
techniques do little to predict the potential of susceptibility, and failure to
find a problem in early design can have significant financial consequences.
Accurately testing for crosstalk susceptibility in an efficient manner
is not easy. In many cases, a problem will only show up under a specific
condition, which often is not duplicated during design characterization. This
webcast discusses the problem and the reason why testing often fails to find
crosstalk problems. An alternative method which quickly and repeatedly finds the
crosstalk susceptibility of a device is presented. Finally a real life test on
an actual device is performed to show the difference in results between
conventional testing and the use of this method.
- SERDES designers
- Comm IC designers
- Mixed signal IC designers
- Production test engineers
- PC, tablet, smartphone designers
- Standards compliance verification engineers
Steve Sekel, Strategic Product Planner, Agilent
Steve Sekel has been involved with electronic Test and
Measurement instrumentation for over 30 years. During this time he has held a
number of roles in Product Marketing, Project Management, and Design Engineering
with some of the leading T&M companies. At Agilent Technologies, Steve is
currently the Strategic Product Planner for BERT products serving the Datacom
and Telecom market segments. Steve has degrees in Electrical Engineering as well
as Computer and Information science. He has presented papers and seminars in the
USA and internationally. Steve is named as the primary or contributing inventor
on over 10 patents.
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