Overview:
Electromagnetic interference is increasingly
becoming a problem in complex systems that must interoperate in both high speed
digital and RF domains. When failures due to EMI occur it is often difficult to
track down the sources of such failures using standard test receivers and
spectrum analyzers.

This session will present a method of evaluating EMI
in real time using a near field probe. The unique ability of real-time spectrum
analysis and synchronous time domain signal acquisition to capture transient
events in the time and frequency domains reveals details about the sources of
EMI such as power supply switching and poor grounding that can quickly lead to
mitigation strategies. The details of near-field EMI measurements will be
presented along with a measurement example.

What you will
learn:

  • Common EMI problems
  • Methods of evaluating EMI in real time using a near field probes
  • How to capture transient events synchronously in the time and frequency
    domains

Presenter:
Mike
Schnecker, Business Development Manager, Rohde & Schwarz

Mike
Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in
electrical engineering. He has 22 years of experience in the test and
measurement industry in applications, sales and product development roles, and
has specialized in signal integrity applications including jitter using
oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr.
Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was
responsible for the deployment of the SDA series of serial data analyzers.