Overview:
Electromagnetic interference is increasingly becoming a problem in complex systems that must interoperate in both digital and RF domains. When failures due to EMI occur it is often difficult to track down the sources of such failures using standard test receivers and spectrum analyzers. The unique ability of real-time spectrum analysis and synchronous time domain signal acquisition to capture transient events can quickly reveals details about the sources of EMI.

What You Will Learn:

  • How to isolate and analyze sources of EMI using an oscilloscope
  • Measurement considerations for correlating time and frequency domains
  • Near field probing basics

Presenter:

Dave Rishavy, Product Manager Oscilloscopes, Rohde & Schwarz
Dave Rishavy has a BS in Electrical Engineering from Florida State University and an MBA from the University of Colorado. Prior to joining Rohde and Schwarz, Mr. Rishavy gained over 15 years of experience in the test and measurement field at Agilent Technologies. This included positions in a wide range of technical marketing areas such as application engineering, product marketing, marketing management and strategic product planning. While at Agilent, Dave led the marketing and industry segment teams for the Infiniium line of oscilloscopes as well as high end logic analysis.