Noise is the ever-present foe of good RF & Microwave measurements, limiting dynamic range and the accuracy of small-signal measurements. This webcast will cover measurement techniques and signal analyzer features, both old and new, which can dramatically reduce the effects of noise and improve both accuracy and speed. Both RF and microwave measurements will be discussed, along with the extra challenges associated with near-noise analysis.

Duration: One hour

Who should view this webcast:
Engineers making spectrum and power measurements for R&D, manufacturing, and calibration in the areas of aerospace/defense and communications, both terrestrial and satellite. The material applies equally to government/military and commercial environments.

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Ben Zarlingo, Product Manager Agilent Technologies

Ben Zarlingo is a product manager for communications test with Agilent Technologies' Microwave & communications Division. He received a BS in Electrical Engineering from Colorado State University in 1980 and has worked for Hewlett-Packard /Agilent Technologies in the areas of spectrum, network and vector signal analysis, with a primary focus on techniques for the design and troubleshooting of emerging communications technologies