This webcast will present Agilent's new Nonlinear Vector Network Analyzer measurement capability. A simple measurement configuration, calibration process and new phase calibration module provide vector corrected nonlinear measurements from 10 MHz to 26.5 GHz. This new NVNA, based on the PNA-X enables active device designers to accurately measure and model nonlinear device characteristics proving measurements such as calibrated amplitude and cross-frequency phase of measurements spectrum, vector corrected time domain waveforms (eg. Measurements of short RF and DC pulses), X-parameters and pulse multi-envelope domain. X-parameters representing the non-linear device can then be directly read into Agilent EEsof's Advanced Design System simulation software for use in non-linear circuit or system design. This process is analogous to the use of measured S-parameters from traditional linear vector network analyzers, but adds the complete non-linear characteristics of the device.

Duration: One hour

Who should view this Webcast:
Customers who are working on active devices, such as amplifiers, who need to accurately characterize and/or model the behavior. Typical applications are accurately measuring the vector corrected amplitude and cross-frequency phase information to/from the device, measuring short RF and DC pulses, vector corrected time domain waveforms and more.

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kyle_egbert.jpgLoren Betts, Senior Engineer, Agilent Technologies

Loren received a B. Sc. degree in computer engineering from the University of Alberta, Edmonton, Alberta, Canada in 1997. He received a M. Sc. degree in electrical engineering from Stanford University, Stanford, California in 2003. Currently he is working on his Ph. D. degree in electrical engineering from The University of Leeds, Leeds, UK.

He is currently a senior engineer at Agilent Technologies focusing on complex stimulus/response measurements and modeling of nonlinear devices utilizing vector network analyzers. He originated and co-developed recent developments in pulse measurement detection algorithms utilized in current Agilent VNA's. He was also instrumental in driving the current multiport measurement and control schemes used in current Agilent VNA's. He has also authored or coauthored numerous articles in magazines, trade journals, conferences, and customer presentations.