This webcast explains how to evaluate and value the Non-Banner Specifications of Waveform Digitizers. Beyond the spec sheet's usual banner listings — such as bandwidth, sampling rate, bit resolution, memory depth, etc. — are a host of performance criteria that need to be taken into account, to determine the actual measurement fidelity the digitizer system will give you. Topics like Signal to Noise Ratio (SNR), Effective Number of Bits (ENOB) will be explained in detail as well as clock accuracy, aperture time and uncertainty, trigger jitter, bandwidth response curve and also… why a "Trigger-Time-Interpolator" enhances your timing measurement results and why longer acquisition memories give higher bandwidth measurements. The webcast also will touch base on Agilent's unique features such as clock and trigger synchronization system for multi channel applications.

The cited digitizer characteristics are referenced to real life practical measurement challenges in a number of applications, such as: Ultrasonics Non-Destructive Testing, RADAR Transmitter Testing, Thomson Scattering Plasma Temperature Measurement, Neutron Time-of-Flight Data Acquisition.

Duration: One hour

Who should view this Webcast: Design and Development engineers, Engineering management, Hardware Design engineers, Technical management, Scientists/Researchers, Software Development engineers, and Test or Manufacturing engineers

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Phil Gregor, Data Converter Sales Specialist, Agilent Technologies

Phil has worked 7 years with GTE Laboratories in R&D in plasma physics, 2 years with LeCroy in T&M sales, 2 years with Agema in technical support management of infra-red systems and 9 years with Agilent/Acqiris as a Sales Manager. Phil holds a BS in physics from the University of MA at Amherst.

2nd presenter TBD