Overview:
There are a large number of different jitter measurements from period and phase jitter measurements, to jitter decomposition and BER analysis. This 1 hour webinar will define the categories and types of jitter and how each of these measurements might be applicable to your task or application. 
Presenter:
Jit Lim, Senior Technologist for High Speed Signal Analysis, Tektronix 
Jit Lim has an Electrical Engineering degree from the Massachusetts Institute of Technology with over 20 years experience in the Test and Measurement Industry. He has extensive experience in signal integrity, jitter analysis, and physical layer characterization of high-speed signals. Jit has published numerous technical papers and has helped many of the world’s leading-edge technology companies with their test and measurement challenges. He has also designed some of Tektronix’ highest-performance real-time scopes and jitter analysis solutions. Mr. Lim has been with Tektronix for 24 years and is the Tektronix Senior Technologist for High Speed Signal Analysis.