Advanced Nonlinear Device Characterization Utilizing Nonlinear Vector Network Analyzer and X-parameters with Arbitrary Load Dependence
This presentation will focus on Agilent's Nonlinear Vector Network Analyzer (NVNA) measurement capability as well as the application of X-parameters for the design and analysis of active components. The NVNA enables active device designers to accurately measure and model nonlinear device characteristics providing measurements such as calibrated amplitude, cross-frequency phase of frequency spectrum, vector corrected time domain waveforms, X-parameters, and pulse multi-envelope domain for analysis of long term memory effects.
Duration: One hour
Who should view this Webcast:
Customers who are working on active components, such as amplifiers, who need to accurately characterize and/or model the component behavior over a wide range of large signal operating conditions.
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Loren Betts, Research Scientist, Agilent Technologies
Loren Betts received his BS degree in computer engineering from the University of Alberta, Edmonton, Alberta, Canada, in 1997, and his MS degree in electrical engineering from Stanford University, Stanford, CA, in 2003. Currently he is completing his PhD degree in electrical engineering from The University of Leeds, Leeds, UK. His PhD research is focused on the Nonlinear Vector Network Analyzer (NVNA) based on the Agilent PNA-X. He led a team that won the "Barnholt Innovation Award" for the NVNA as the invention of the year at Agilent Technologies in 2008. He was also a finalist for the EETimes ACE awards for "Innovator of the Year".
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