Accelerating Test and Measurement with Intelligent Memories
In this webinar we will review some of the issues faced by designers of Test and Measurement system Designers. We will then review how the MoSys Intelligent memory family can address the issues with a unique and targeted feature set of functions.
Attendees will learn about:
- How electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs)
- The MoSys devices are used in the data capture area of the system and can support interfaces that need individual throughputs of up to 400Gbps
- T & M network system(s) with 100Gbps interfaces
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