The Field Programmable Gate Array (FPGA) is a low risk solution to implementing silicon architectures in today’s fast paced product development cycle. However, the gigabit transceiver block within the FPGA requires careful design to avoid degrading performance of the high-speed channels. Furthermore, the method of characterizing these transceiver channels within the FPGA is highly dependent upon the bandwidth of the printed circuit board fixture upon which the silicon FPGA die is attached. This paper will discuss advanced calibration techniques that allow proper and accurate performance analysis of these high-speed channels associated with the FPGA.