Experience has shown that stable memory is crucial for reliable use of modern electronic devices. Electronic devices use entire memory subsystems for storing applications, running programs, and storing data. Faulty memory can prevent a device from running, cause it to crash unexpectedly, or behave unreliably. Understanding test strategies for various memory technologies is of the utmost importance. Presented in this paper is a comprehensive memory validation strategy for automated tuning of memory, accurately determining the reliability of entire memory subsystems, pinpointing faults when repair is required, and deploying the same core solution used in design and manufacturing with the final product.