Transient-testing platforms and automation techniques for LDOs and buck regulators
With mobile processors in wireless devices operating in the gigahertz range, there is increasing consumer demand for higher performance, longer battery life, smaller size, and lower cost. Therefore, the design of power management circuits is becoming an increasingly complex issue. Low dropout regulators (LDOs) and switching regulators are indispensable components in portable systems with standalone regulators and power management units (PMUs). As high-speed and portable communications devices employ regulators that require faster response time, it is necessary to rigorously validate regulator performance and merits in order to ensure reliable power management products.
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