Using a methodology such as graph-based intelligent testbench automation to efficiently create verification scenarios and stimuli is a powerful way to enhance advanced verification environments to reduce common verification headaches. It can help to free up resources—in terms of time, people and hardware—to focus on the challenges of realizing a more ambitious verification plan and of creating better functional coverage metrics. This enables the verification team to ensure that the device has been exercised in a far more comprehensive manner, thereby reducing the resulting defect density. This paper explores a unique solution to two challenges: definition of adequate coverage measurement and the setup of efficient automated testbenches.

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