IoT brings a diverse array of technologies, multiple standards and minimal compatibility, as well as a new set of challenges for design and manufacturing, particularly in mission-critical IoT applications like health care, factory automation and transportation. With the stakes high it’s crucial that designers have confidence in their chipsets, modules, end devices and networks, especially in the RF domain, where environments significantly change once they reach the end users. Anritsu’s white paper identifies several mission-critical IoT applications, common RF test methods and their respective challenges, and how next-generation test solutions can help to lower test costs, and shorten time-to-market.