Testing High Speed Serial IO Interfaces Based on Spectral Jitter Decomposition
This paper proposes a new method to verify the jitter performance by decomposition into its spectral components. The implementation for spectral jitter decomposition deploys the conventional real-time compare to expected data on ATE or BERT equipment. The key difference is a different sampling point location used for comparing. The spectral power density is calculated from the obtained error signal, yielding the jitter energy spectrum.
By analyzing their spectral properties, the measurement results identify parasitic jitter sources that crosstalk into sensitive high-speed IO interfaces like PCI Express, S-ATA and XAUI. The paper shares experimental results and provides a mathematical description of the proposed method for an in-depth understanding.
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