Various memory elements within electronic devices are susceptible to configuration upset when impacted by high energy particles within the Earth’s atmosphere. In addition, other elements of a device may propagate induced pulses or transients that can result in errors in function. Given the potential exposure of medical devices to high neutron fluxes (due to cosmic rays as well as LINACs used in radiotherapy), designers must consider the impact of SEUs on safety and reliability. Microsemi offers devices whose base technology is fundamentally immune to configuration upset and is positioned to help designers understand the impact of SEUs and SETs and mitigate their effect.