Running Scan Test On Three Pins: Yes We Can
This white paper proposes to examine all the why and how of these developments along with the good results obtained during that time, in terms of test cost improvement, area overhead in silicon, design flow updates and industrialization process. Getting all sensors designed today equipped and test data volume (and time) improvements in the range of 25X to 30X just took that three years time. Now that the solution is industrially available, it’s also time to share and look at the future of industrial scan test on three pins.
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