The Robustness of Various Test Compression Techniques
Larger designs and the growing population of non-stuck defects have led many companies to adopt test compression techniques. In fact, the Embedded Deterministic Test (EDT) technology within TestKompress has now been used in roughly one billion production chips. There has been a surge of compression techniques promoted in the industry since TestKompress was released in 2003. So, why has TestKompress become the standard approach in industry? This paper will try to explain the technology behind the various compression techniques and their robustness in the presence of Xs, false and multi-cycle paths, low pin access, and other design factors.
Note: By clicking on the above link, this paper will be emailed to your EE Times log-in address by Mentor Graphics.
Please disable any pop-up blockers for proper viewing of this Whitepaper.