With continuously increasing data rates, signal integrity aspects of high-speed digital designs and the components used become more and more challenging. Particularly at higher data rates, vector network analyzers (VNA) are increasingly replacing traditional time domain reflectometry (TDR) setups for testing passive components such as connectors, cables, PCBs, etc. Users benefit from the higher accuracy, speed and ESD robustness of the VNA, making the VNA the instrument of choice in this field.