The majority of analog cells and circuits are presently tested (if tested at all) via customized “point solutions,” using expensive but limited-throughput analog testers. For mixed signal devices, digital testers are also required. Devices may even be moved between one type of tester and another to complete the testing, further adding to costs.

A new approach is needed for testing analog circuits, especially where they form part of mixed signal devices. Ideally, the approach must be capable of improving throughput by rapid testing and parallelizing. The technique should also be direct, intuitive, based solidly on existing practices, and be readily integrated into existing design and test tool flows. This paper discusses the challenges of analog circuit and mixed signal device testing and introduces a test paradigm and software tool from Ateeda that can help designers to meet testing demands.