Multi-Layer Deep Data Performance Monitoring and Optimization
As our world becomes more reliant on increasingly complex electronic devices, the ability to monitor and optimize their safety, reliability and performance becomes essential.
This paper outlines a new approach to performance monitoring and optimization of advanced electronics based on multi-layer deep data. This new approach addresses key semiconductor industry pain points including design sensitivities, software and hardware bugs, device early-failure and wear-out, functional safety, and malicious attacks. Combining functional and parametric monitoring of real-world behavior of complex SoCs offers radical improvements in time-to-revenue and product quality and safety, while increasing reliability and enabling predictive maintenance strategies that can prevent field failures.
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