In this work, test-patterns, test-cases and layout-patterns generations are widely investigated in the sense of turnaround time for creation and/or modification. STPRL, a novel behavioral modeling language for test-pattern creation, is being proposed. The turn-around time for both creation and modification is hugely reduced at no degradation in either accuracy or performance. Furthermore, STPRL provides considerable performance improvements in custom test patterns creation over available automatic layout creation tools. Our method has been verified with real data at different node-technologies and for migration from and between different technology nodes.

Note: By clicking on the above link, this paper will be emailed to your TechOnline log-in address by Mentor Graphics.