Metastability Measurement of CMOS Master Slave FlipFlops
This paper presents a circuit technique used to improve the Mean Time Between Failures (MTBF) of a latch due to metastable events. The complete approach includes design of the latch and formation of series connected Master/Slave (M/S) Flipflops using this latch. An equation is formulated to measure the MTBF of single latch and series connected M/S flipflops. The equation also predicts that MTBF of M/S Flipflops increases effectively due to series connection of latch.
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