LLCR Pin Socket Testing with the Model 3732 High Density Matrix Card
CPUs draw more power, run at lower voltages, and have more pins than ever before. However, any significant resistance in the contacts between the CPU and its socket can cause large voltage drops and excess heat, rendering the CPU inoperable. Because of this, it is critical that the contact resistance be minimized. This document describes how to configure a Low Level Contact Resistance (LLCR) test system.
Please disable any pop-up blockers for proper viewing of this Whitepaper.