One of the most difficult problems associated with integrating DC current-voltage, capacitance-voltage, and pulse-based measurements into an integrated semiconductor device characterizer is that the cabling required for each measurement type is fundamentally different. Although the cabling from the instrument to the probe station bulkhead and feed through is fairly straightforward, the cabling from the bulkhead to the probe tips can be confusing and difficult. This paper outlines the different cabling requirements and describes a multi-measurement cabling system that addresses these measurement challenges.