Integrated diagnostics apply system reliability features at the ADC device level
Reliability is one of the principles on which all engineering disciplines are based. In the 21st century and beyond, it will become more critical as we rely more heavily on technology to improve our lives. From self-driving vehicles to smart energy deliver to factory automation, the need for integrated reliability features in electronic systems will only increase. To help meet that need, a growing trend within the field of analog IC design is to take system-level reliability features and apply those at a device level. In this way, engineers provide a new level of information that, when used properly, can help decrease the probability of device failure, allowing for a more reliable system.
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